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SEMM-2: A new generation of single-event-effect modeling tools

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1 Author(s)
H. H. K. Tang ; IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598, USA

The IBM soft-error Monte Carlo model SEMM-2 is a new general-purpose simulation platform developed for single-event-effect (SEE) analysis of advanced CMOS (complementary metal-oxide semiconductor) technologies. The current status and major features of this system are presented in this paper, including the physics model modules for the relevant atomic and nuclear processes, the construction and application of databases, and the simulation methodologies used to solve general transport problems. SEE analysis can be carried out for a large class of radiation subatomic particles in arbitrarily complex geometries and material composition of the integrated circuit designs.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:52 ,  Issue: 3 )