Scheduled System Maintenance:
On May 6th, system maintenance will take place from 8:00 AM - 12:00 PM ET (12:00 - 16:00 UTC). During this time, there may be intermittent impact on performance. We apologize for the inconvenience.
By Topic

Towards Selecting Test Data Using Topological Structure of Boolean Expressions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
5 Author(s)
Lian Yu ; Sch. of Software & Microelectron., Peking Univ., Beijing, China ; Tsai, W.-T. ; Wei Zhao ; Jun Zhu
more authors

Boolean expressions can be used in programs and specifications to describe the complex logic decisions in mission-critical, safety-critical and Web services applications. We define a topological model (T-model) to represent Boolean expressions and characterize the test data. This paper provides proofs of relevant T-model properties, employs the combinatorial design approach, and proposes a family of strategies and techniques to detect a variety of faults associated with Boolean expressions. We compare our strategies with MC/DC, MUMCUT, MANY-A, MANY-B, MAX-A and MAX-B, and conclude that T-model based approach detects more types of faults than MC/DC, MUMCUT MANY-A and MAX-A, and detects the same types but more instances of faults than MANY-B and MAX-B with much smaller test data set.

Published in:

Quality Software, 2009. QSIC '09. 9th International Conference on

Date of Conference:

24-25 Aug. 2009