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RST Invarian Watermarking Scheme Based on SIFT Feature and Pseudo-Zernike Moment

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2 Author(s)
Sun Jin-guang ; Dept. of Electron. & Inf. Eng., Liaoning Techinical Universit, HuLuDao, China ; He Wei

RST invarian watermarking scheme is proposed in this paper based on the SIFT feature points and improved pseudo-Zernike moment. Firstly, feature points are detected using SIFT, and some suitable points are selected to form localized feature regions which are scaled to a standard sized. After computing these regions by the improved pseudo-Zernike moments of these regions , the digital watermark are embedded into the host image by quantizing some low-lever moments. Experimental results show this scheme is robust against the rotation, shearing, JPEG compression, noise and filtering attack.

Published in:

Computational Intelligence and Design, 2009. ISCID '09. Second International Symposium on  (Volume:2 )

Date of Conference:

12-14 Dec. 2009

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