By Topic

Plasmonic nanoprobe integrated with near-field scanning microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Yuyan Wang ; Department of Biomedical Engineering, University of Texas at Austin, USA ; Yu-Yen Huang ; Kazunori Hoshino ; Yujan Shrestha
more authors

Plasmonic enhanced scanning nanoprobes are designed, fabricated, and integrated with near-field scanning microscopic (NSOM) system for multi-functional nanoscale perturbation, detection and imaging. Both transmission scanning measurements and simulations are demonstrated and analyzed.

Published in:

2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics

Date of Conference:

17-20 Aug. 2009