IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Radiation Effects Data Worksh ... Help

Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

12 Author(s)
Cochran, D.J. ; NASA Goddard Space Flight Center (GSFC), MEI Technol. Inc., Greenbelt, MD, USA ; Buchner, S.P. ; Dakai Chen ; Kim, H.S.
more authors

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.

Published in:
Radiation Effects Data Workshop, 2009 IEEE

Date of Conference: 20-24 July 2009

Page(s):
25 - 31
Print ISBN:
978-1-4244-5092-3
INSPEC Accession Number:
10977523
Conference Location :
Quebec City, QC
Digital Object Identifier :
10.1109/REDW.2009.5336318
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.