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TID and SEE Characterizations of New Radiation-Hardened Bipolar Operational Amplifiers

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5 Author(s)
Chaumont, G. ; STMicroelectronics, Rennes, France ; Cornanguer, B. ; Briand, P. ; Prugne, C.
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New radiation-hardened operational amplifiers have been ELDRS and SEE characterized. This paper presents the TID results at high and low dose rates up to 300 krad(Si) and the SEE test results.

Published in:

Radiation Effects Data Workshop, 2009 IEEE

Date of Conference:

20-24 July 2009