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Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

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3 Author(s)
Kruckmeyer, K. ; Nat. Semicond., Santa Clara, CA, USA ; Buchner, S.P. ; DasGupta, Sandeepan

Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor's LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog products reported by others plus raise new considerations when evaluating SET test results.

Published in:

Radiation Effects Data Workshop, 2009 IEEE

Date of Conference:

20-24 July 2009

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