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It's DFT, boundary scan and life cycle benefits

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1 Author(s)
O'Donnell, G. ; Nat. Semicond. Corp., South Portland, ME

Testing is a necessary, but non-value-added operation. Test methods that are internal, and can reduce the capital required to produce a specified level of quality will be critical to reducing the cost of test. As such, methods such as internal scan, boundary scan, and BIST will reduce the requirements for capital intensive external test equipment, and evidence and experience have shown can reduce the cost of testing. It is possible to add value to the test function by either extending its definition and role out to the final customer or to the customer's customers. In this way, test can become part of the design criteria and functional features that are provided to the end customer. System level implementations of boundary scan are some new examples of how this can be achieved. The role of the test engineer must change to facilitate the need for DFM and value added system level implementations. The test engineer needs to become part designer, part customer advocate, part team leader, and part accountant to integrate the role and benefit of all these new technologies

Published in:

Test Conference, 1995. Proceedings., International

Date of Conference:

21-25 Oct 1995

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