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In test set embedding built-in self test schemes the test set is embedded into the sequence generated by the BIST pattern generator. Single-seed embedding schemes embed the test set into a single sequence. This calls for a need to evaluate the location of each test pattern in the sequence as fast as possible, in order to try as many as possible candidate configurations for the test pattern generator. This problem is known as the test vector-embedding problem. In this paper we present a novel solution to the test vector-embedding problem for sequences generated by accumulators. The time overhead of the solution is of the order O(1).