By Topic

Towards 100% testable FIR digital filters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
L. Goodby ; Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA ; A. Orailoglu

Testability problems that arise in the design of fixed-coefficient finite impulse response (FIR) filters are examined. A class of redundant faults that naturally derive from the structure and behavior of these filters are examined, and design-for-test (DFT) techniques based on scaling theory are used to eliminate the redundancies. Eliminating these redundancies makes it possible for built-in self-test (BIST) approaches to reach 100% coverage, and automatic test-pattern generation (ATPG) based approaches can benefit by more than an order of magnitude reduction in test generation time. A case study provides a demonstration of the approach

Published in:

Test Conference, 1995. Proceedings., International

Date of Conference:

21-25 Oct 1995