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An IDDQ based built-in concurrent test technique for interconnects in a boundary scan environment

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3 Author(s)
Chauchin Su ; Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan ; Kychin Hwang ; Shyh-Jye Jou,

An IDDQ based scheme has been presented for concurrent built-in self-test of MCM interconnects. The scheme detects interconnect faults while the system is on-line

Published in:

Test Conference, 1994. Proceedings., International

Date of Conference:

2-6 Oct1994

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