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An integrated approach for analog circuit testing with a minimum number of detected parameters

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3 Author(s)
M. Slamani ; Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada ; B. Kaminska ; G. Quesnel

A technique for multifrequency test vector generation using testability analysis and output response detection by adding a translation built-in self test (T-BIST) is presented. We study the testability of analog circuits in the frequency domain by introducing the analog fault observability concept. This testability evaluation will be helpful in generating the test vectors and for selecting test nodes for the various types of faults. In the proposed approach test vector generation and test point selection allow a significant reduction in the number of measured output parameters necessary for testing (to one or two parameters) without a loss in fault coverage. The T-BIST approach consists of verifying whether or not the tested parameters for the given test vector are within the acceptance range. This technique is based on the conversion of each detected parameter to a DC voltage. Results are presented for different practical filters for which a complete test solution was achieved

Published in:

Test Conference, 1994. Proceedings., International

Date of Conference:

2-6 Oct1994