Referenced Items are not available for this document.
The IEEE 1149.1 Test Access Port and Boundary-Scan Architecture Standard can be used at many different levels in the integration hierarchy of a product. However there is one level where using the standard poses some difficulty. This is multi-chip modules (MCM). This paper explores the problem and proposes a set of solutions for different classes of MCMs
Published in:
Test Conference, 1994. Proceedings., International
Date of Conference: 2-6 Oct1994
- Page(s):
- 446 - 455
- Meeting Date :
- 02 Oct 1994-06 Oct 1994
- ISSN :
- 1089-3539
- Print ISBN:
- 0-7803-2103-0
- INSPEC Accession Number:
- 4847009
- Conference Location :
- Washington, DC
- Digital Object Identifier :
- 10.1109/TEST.1994.527986
- Product Type:
- Conference Publications
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