Referenced Items are not available for this document.
Future analysis tools that predict the behavior of electronic components, both during qualification testing and in-service lifetime assessment, will be very important in predicting product reliability and identifying when to undertake maintenance. This paper will discuss some of these techniques and illustrate these with examples. The paper will also discuss future challenges for these techniques.
Published in:
Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
Date of Conference: 7-11 May 2008
- Page(s):
- 67 - 72
- E-ISBN :
- 978-1-4244-3974-4
- Print ISBN:
- 978-1-4244-3972-0
- INSPEC Accession Number:
- 10905978
- Conference Location :
- Budapest
- Digital Object Identifier :
- 10.1109/ISSE.2008.5276460
- Product Type:
- Conference Publications
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