Testing and Qualification

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1 Author(s)

This chapter contains sections titled:

  • Introduction

  • Testing: General Concepts

  • Testing of Memory Chips

  • Design for Testability

  • Other Aspects of Functional Testing

  • Critical Issue: Boundary Scan

  • Critical Issue: Known Good Die (KGD)

  • Summary

  • This chapter contains sections titled:

  • Exercises

  • References