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Economic Analysis of the HOY Wireless Test Methodology

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4 Author(s)
YuTsao Hsing ; National Tsing Hua University, Hsinchu ; LiMing Denq ; Chao-Hsun Chen ; Cheng-Wen Wu

The HOY (Hypothesis, Odyssey, and Yield) test system provides wireless test access and embedded DFT, while offering lower cost and better performance than conventional ATE. This article briefly describes HOY, then proposes a test cost model to compare it with conventional ATE, and analyzes the test cost of these two methods for different manufacturing processes, area overheads, die sizes, manufacturing volumes, and test times.

Published in:

IEEE Design & Test of Computers  (Volume:27 ,  Issue: 3 )