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Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis

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3 Author(s)
Manish Sharma ; Mentor Graphics, Wilsonville ; Chris Schuermyer ; Brady Benware

The cost and cycle time for determining the root cause of yield loss continues to increase as semiconductor technology scales down. A new technique, Axiom, helps yield and product engineers determine the root cause of loss directly from diagnosis results. Consequently, root-cause cycle time is dramatically reduced, resulting in a higher physical-failure analysis success rate and reduced costs.

Published in:

IEEE Design & Test of Computers  (Volume:27 ,  Issue: 3 )