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Dual Threshold Domino OR Gates Leakage Power and Delay Forecasting Based on Wavelet Neural Networks in 45 nm Technology

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7 Author(s)
Jinhui Wang ; VLSI & Syst. Lab., Beijing Univ. of Technol., Beijing, China ; Wuchen Wu ; Na Gong ; Lei Zuo
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An approach for forecasting the leakage power and the delay of the dual threshold domino OR gates based on wavelet neural networks (WNN) in 45 nm technology is proposed. The forecasting system has fast convergence and high precision. By studying the impact of the dual threshold voltage technique (DTV) on leakage reduction and delay increase, it successfully forecasts the nonlinear changing of the leakage power and delay of the different inputs domino OR gates. At last, the reason for the forecasting error and the trend of the forecasting curve are explained, respectively.

Published in:

Intelligent Systems, 2009. GCIS '09. WRI Global Congress on  (Volume:4 )

Date of Conference:

19-21 May 2009