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Tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance

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6 Author(s)

Tunable replica circuits are used in conjunction with error-detection sequentials and dynamic voltage and frequency techniques to adapt to voltage, temperature, and aging variations. Measurements on a 45nm test chip demonstrate the delay sensitivity of replica circuits to voltage, temperature, and AC/AC stress and recovery.

Published in:

VLSI Circuits, 2009 Symposium on

Date of Conference:

16-18 June 2009