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Temporal redundancy techniques will no longer be able to cope with radiation induced soft errors in technologies beyond the 45 nm node, because transients will last longer than the cycle time of circuits. The use of spatial redundancy techniques will also be precluded, due to their intrinsic high power and area overheads. The use of algorithm level techniques to detect and correct errors with low cost has been proposed in previous works, using a matrix multiplication algorithm as the case study. In this paper, a new approach to deal with this problem is proposed, in which the time required to recompute the erroneous element when an error is detected is minimized.