Cart (Loading....) | Create Account
Close category search window
 

SRAM cell design using tri-state devices for SEU protection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shiyanovskii, Y. ; Case Western Reserve Univ., Cleveland, OH, USA ; Wolff, F. ; Papachristou, C.

A new SRAM cell model, SRAMT, is presented providing a scalable solution to soft error for various energy levels of protection with minimal power consumption and write time penalties. Our model is based on a classic 6 transistor inner core SRAM cell and an outer core consisting of enhanced tri-state inverters. The outer core will absorb a particle strike at a sensitive node of the SRAM cell without a major impact on write time performance or area overhead. The model provides an on-demand protection due to the fact that the outer core can be shut off during non-essential operating mode. The on-demand aspect of the design provides a much more favorable power consumption overhead compared to the existing hardening technique. The gains in power consumption overhead reduction increase as we scale down the process technology from 90 nm to 32 nm. We simulated extensively our model and provided results for various energy levels of soft error protection. We also compared our method to the standard hardening technique in terms of layout area, performance and power consumption overhead for for 90 nm, 65 nm, 45 nm and 32 nm process technologies.

Published in:

On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International

Date of Conference:

24-26 June 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.