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Aging analysis of circuit timing considering NBTI and HCI

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3 Author(s)
Lorenz, D. ; Inst. for Electron. Design Autom., Tech. Univ. Munchen, Munich, Germany ; Georgakos, G. ; Schlichtmann, U.

We present an aging analysis flow able to calculate the degraded circuit timing. To the best of our knowledge it is the first approach on gate level so far capable of analyzing the impact of the two dominant drift-related aging effects - NBTI and HCI - on complex digital circuits. The aging-aware gate model used to compute the aged circuit timing provides not just the cell delay degradation, but also the degradation of the output slope. To get more accurate results, the individual workload of a gate can be considered.

Published in:

On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International

Date of Conference:

24-26 June 2009