Referenced Items are not available for this document.
We utilize low-frequency noise measurements to examine the sub-threshold voltage (sub-VTH) operation of highly scaled devices. We find that the sub-VTH low-frequency noise is dominated by random telegraph noise (RTN). The RTN is exacerbated both by channel dimension scaling and reducing the gate overdrive into the sub-VTH regime. These large RTN fluctuations greatly impact circuit variability and represent a troubling obstacle that must be solved if sub-VTH operation is to become a viable solution for low-power applications.
Published in:
IC Design and Technology, 2009. ICICDT '09. IEEE International Conference on
Date of Conference: 18-20 May 2009
- Page(s):
- 17 - 20
- E-ISBN :
- 978-1-4244-2934-9
- Print ISBN:
- 978-1-4244-2933-2
- INSPEC Accession Number:
- 10779763
- Conference Location :
- Austin, TX
- Digital Object Identifier :
- 10.1109/ICICDT.2009.5166255
- Product Type:
- Conference Publications
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