Testing self-timed circuits using partial scan

This paper presents a partial scan method for testing both the control and data path parts of macromodule based self-timed circuits for stuck-at faults. Compared with other proposed test methods for testing control paths in self-timed circuits, this technique offers better fault coverage under a stuck-at input model than methods using self-checking properties, and requires fewer storage elements to be made scannable than full scan approaches with similar fault coverage. A new method is proposed to test the sequential network in the control path in this partial scan environment. The partial scan approach has also been applied to data paths, where structural analysis is used to select which latches should be made scannable to break cycles in the circuit. Experimental data is presented to show that high fault coverage is possible using this method with only a subset of storage elements in the control and data paths being made scannable.