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This paper describes a procedure for comparing calibrated nonlinear radio-frequency (RF) measurements performed on a nonlinear device by five different measurement laboratories. The device under test (DUT) is a nonlinear active semiconductor device that is designed to generate a maximum number of harmonic tones. The goal is to obtain a simple automated method that detects if some laboratory had measurement problems during the measurement campaign. The developed comparison method is based on the analysis of variance (ANOVA) technique.