Cart (Loading....) | Create Account
Close category search window
 

Turn-on field distribution of field-emitting sites in carbon nanotube film: Study with luminescent image

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Weihua Liu ; School of Electronics and Information Engineering, Xi’an Jiaotong University, Xian Ning Road No. 28, Xi’an 710049, People’s Republic of China ; Zeng, Fanguang ; Li Xin ; Changchun Zhu
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.2817633 

The turn-on field distribution of emission sites in carbon nanotube (CNT) film are measured by counting lighting dots. This provides a convenient method to characterize the field-emission uniformity of a CNT cathode. With this method, a quantitative characterization of the emission-uniformity improvement of a printed CNT film after a conditioning is obtained. The turn-on field distribution of an array of CNT dots in a pixel also can be measured with this method.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:26 ,  Issue: 1 )

Date of Publication:

Jan 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.