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Electrostatic tip-surface interaction in scanning force microscopy: A convenient expression useful for arbitrary tip and sample geometries

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2 Author(s)
Zypman, F.R. ; Department of Physics and Electronics, University of Puerto Rico, Humacao, Puerto Rico 00791-4300 ; Eppell, Steven J.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.589567 

The electrostatic energy between a dielectric scanning force microscope (SFM) tip and a point charge is obtained in closed form as a function of the separation of the two objects. Applications of this result to both spherical and arbitrary tip shapes are discussed. Also, utilizing kinematic data, a method is given to experimentally extract the force due to the tip-sample interaction from a typical SFM instrument. This is done by analyzing the time dependent motion of the tip. The result is based on the use of a time dependent analysis of the force distance curve which is unavoidable in motion regimes in which the tip accelerates, as in the snap-to-contact process. © 1997 American Vacuum Society.  

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:15 ,  Issue: 6 )

Date of Publication:

Nov 1997

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