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In this paper, a low-cost ADC output response analyzer (ORA) circuit for built-in self-test (BIST) application is proposed. The sine-wave histogram testing method and the basic coordinate rotation digital computer (CORDIC) technique are used to design the proposed ADC ORA circuit. The ADC's static and dynamic parameters can both be obtained using the proposed circuit. The basic CORDIC based ADC ORA circuit is designed and synthesized in a 0.18-mum technology to analyze the outputs an 8-bit ADC to verify the designs. It shows a lower area overhead compared with the fast Fourier transform (FFT) based realization.
Published in:
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Date of Conference: 28-29 April 2009
- Page(s):
- 1 - 4
- Print ISBN:
- 978-1-4244-2587-7
- INSPEC Accession Number:
- 10665688
- Conference Location :
- Chengdu
- Digital Object Identifier :
- 10.1109/CAS-ICTD.2009.4960751
- Product Type:
- Conference Publications
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