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FPGA Based System for Open, Short, and RC Impedance Measurement

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1 Author(s)
Newman, K.E. ; Electr. & Comput. Eng. Dept., Univ. of Denver, Denver, CO, USA

This paper describes a time-based digital test system that may be used to detect opens, and shorts, as well as measure resistive and capacitive impedance of interconnect networks. The specific test implementation is customized through a field programmable gate array (FPGA). The use of an FPGA allows for reconfiguration of the test for many different interconnect verifications. The current progress of this system is demonstrated and experimental measurements are provided.

Published in:

Advanced Packaging, IEEE Transactions on  (Volume:33 ,  Issue: 1 )