By Topic

Thermal stability of polycrystalline TiN/CrN superlattice coatings

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yang, Q. ; Structures, Materials, and Propulsion Laboratory, Institute for Aerospace Research, National Research Council Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada ; Zhao, L.R.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

This article reports the structure and hardness responses of TiN/CrN superlattice coatings to elevated-temperature annealing. Polycrystalline TiN/CrN superlattices with bilayer periods of 5.6–39 nm were deposited on a Ni-base alloy substrate by reactive unbalanced magnetron sputtering. The superlattices were subsequently annealed in vacuum at elevated temperatures for 2–100 h, followed by characterization using small-angle x-ray reflection, high-angle x-ray diffraction, and hardness testing. The superlattices can sustain their hardness up to 650 °C for 4 h or 575 °C for 100 h. A strong correlation exists between the hardness and the x-ray reflection or x-ray diffraction characteristics. A marked reduction in the high-angle satellite/Bragg peak ratio or in the small-angle reflection intensity corresponds to a rapid decrease in the hardness. This phenomenon is related to a physical transition during which the loss of hardness is caused by the structural instability resulting from accelerated interdiffusion between TiN and CrN layers, which leads to reduced compositional modulation amplitude and diffuse layer interfaces. © 2003 American Vacuum Society.

Published in:

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films  (Volume:21 ,  Issue: 3 )