Cart (Loading....) | Create Account
Close category search window
 

Calibration procedure developed for IR surface-temperature measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bennett, G.A. ; Los Alamos Nat. Lab., NM, USA ; Briles, S.D.

Obtaining infrared (IR) surface-temperature measurements of miniature square targets on the order of 1.6 mm with a spatial resolution of 15 μm has recently become possible using the Barnes Engineering Computherm system, but the accuracy and precision of the measurements have been limited. The objective of the present work is to provide a calibration procedure that will improve the accuracy and precision of the two-dimensional temperature measurement. A method of measuring surface temperatures on semiconductor surfaces using subminiature syringe thermocouples to remove the emissivity calculation error is described. Accuracy is further improved by numerically removing the estimated system distortion from the radiance scan image. The precision of the IR microscope is improved by averaging scans to minimize the random noise. Investigations into defining and correcting the distortions and noise have improved the accuracy on precisely controlled black-body sources to ±0.025°C and the precision to ±0.03°C

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:12 ,  Issue: 4 )

Date of Publication:

Dec 1989

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.