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Total dose characterization of the PACE 1750A microprocessor chipset

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3 Author(s)
M. Regula ; Space Satellite Syst., Daimler-Benz Aerosp. AG, Munchen, Germany ; O. Pedersen ; R. R. Konegen

Total dose irradiation characterization testing of the PACE 1750A SOS chipset built on commercial SOS material and of the chipset manufactured using the Westinghouse radiation enhanced process based on 5416 Aerorad Sarnoff silicon epilayer wafers has been performed by Performance Semiconductor Corporation (PSC) and by Daimler-Benz Aerospace (Dasa). Total dose tolerance of the non-hardened chipsets varied between <10 krad(Si) and >100 krad(Si). The radiation hardened chipsets were all radiation hard to levels ⩾100 krad(Si)

Published in:

Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE

Date of Conference:

19 Jul 1995