By Topic

Built-In Self-Test of digital signal processors in Virtex-4 FPGAs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mary D. Pulukuri ; Dept. of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA ; Charles E. Stroud

We present a Built-In Self-Test (BIST) approach for testing and diagnosing the embedded digital signal processors (DSPs) in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The BIST architecture and configurations needed to test these programmable DSPs in all of their modes of operation are presented along with fault injection and timing analysis of the BIST configurations.

Published in:

2009 41st Southeastern Symposium on System Theory

Date of Conference:

15-17 March 2009