Cart (Loading....) | Create Account
Close category search window
 

Voltage-Mode Multifunction Filters Employing a Single DVCC and Grounded Capacitors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Yuce, E. ; Electr. & Electron. Eng. Dept., Pamukkale Univ., Kinikli-Denizli

In this paper, two novel voltage-mode (VM) single-input-three-output (SITO) second-order multifunction analog filters for simultaneously realizing low-pass, bandpass, and high-pass responses from the same topology are proposed. They employ a single dual-output differential voltage current conveyor (DVCC), two grounded capacitors, and three resistors. Both of the proposed filters offer the following two important features: the simultaneous realization of low-pass, bandpass, and high-pass responses and the use of a minimum number of grounded capacitors and a single DVCC. The nonideal gain effects of the developed structures are examined. To show the performance of the proposed VM filters, computer simulation results using the SPICE program, together with ideal ones, are drawn.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:58 ,  Issue: 7 )

Date of Publication:

July 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.