Referenced Items are not available for this document.
This letter reports the results on measurements and modeling of the ultralow current measurement capability of a silicon-on-sapphire current integrator circuit. We have tested the lowest possible current measurable with the device and the noise performance with picoampere input currents. The device is capable of resolving subpicoampere currents with an rms noise of 350 fA in a 110-Hz bandwidth. The device is also capable of digitally measuring currents up to 100 muA by employing a pulse-based A/D converters.
Published in:
Electron Device Letters, IEEE
(Volume:30
,
Issue:
3
)
Date of Publication: March 2009
- Page(s):
- 258 - 260
- ISSN :
- 0741-3106
- INSPEC Accession Number:
- 10499174
- Digital Object Identifier :
- 10.1109/LED.2008.2010564
- Product Type:
- Journals & Magazines
- Date of Publication :
- 27 January 2009
- Date of Current Version :
- 24 February 2009
- Issue Date :
- March 2009
- Sponsored by :
- IEEE Electron Devices Society
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