By Topic

Fast Scaling in the Residue Number System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yinan Kong ; Sch. of Electr. & Electron. Eng., the Univ. of Adelaide, Adelaide, SA ; Braden Phillips

A new scheme for precisely scaling numbers in the residue number system (RNS) is presented. The scale factor K can be any number coprime to the RNS moduli. Lookup table implementations are used as a basis for comparisons between the new scheme and scaling schemes from the literature. It is shown that new scheme decreases hardware complexity compared to previous schemes without affecting time complexity.

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:17 ,  Issue: 3 )