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Improved statistical method for system-level ESD tests

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1 Author(s)
Renninger, R.G. ; AT&T Bell Lab., Murray Hill, NJ, USA

A method for system-level electrostatic discharge (ESD) tests based on both upper and lower statistical limits for system failure probability in an ESD environment is described. This test method specifies test performance with statistical parameters instead of with the more conventional, but less informative, ESD threshold voltage. The method is used to examine the ambiguous system reliability implications of the latest IEC 801-2 international ESD test specification. Step-by-step procedures, including optimal methods for rectifying unusual failures, are given for a reliability-based ESD test that fully meets IEC 801-2 requirements

Published in:

Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on

Date of Conference:

9-13 Aug 1993