Cart (Loading....) | Create Account
Close category search window
 

Designing a Customized Test Data Generator for Effective Testing of a Large Database

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Singh, J. ; Univ. Coll. of Eng., Punjabi Univ., Patiala, India ; Singh, K.

Business houses are investing heavily on new generation databases so as to gain competitive edge. As with any development project, a data warehouse also needs testing. The complexity and size of data warehouse systems make comprehensive testing both "more difficult and more necessary". The fact, queries that perform satisfactorily on small datasets may fail miserably in the real life environment. This necessitates establishing a system that runs queries on fully scaled data. Legal implications and business ethics do not allow to perform testing with real business data. In the paper authors have put efforts to generate test data ensuring correct balance and skewness making sure that the ratio of fact to dimension is correct and so on.

Published in:

Advanced Computer Theory and Engineering, 2008. ICACTE '08. International Conference on

Date of Conference:

20-22 Dec. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.