Test automation of distributed embedded systems based on test object structure information

The integration of distributed embedded systems is error-prone even though the components themselves are error-free. Test automation is getting more and more common in industry to find errors in such complex systems. Our approach uses time-dependent cause-and-effect graphs to describe test cases considering distribution and real-time properties. The use of test object structure benefits better testing depth. We suggest neutral description of test object to decouple proprietary CAE tools for test object management from test automation tools. A simple language describing test objects consisting of modules and connections was defined and realized. It enables graphical documentation and context-sensitive protocol analysis. Symbolic representation of received messages facilitates better comprehension of system behaviour. All concepts are tried and evaluated in the laboratory with building security equipment.