Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Design of Comprehensive Color Feature Vector for Tile Color Online Inspection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Weiqing Li ; Sch. of Eng. & Technol., China Univ. of Geosci., Beijing ; Chengbiao Wang ; Qun Wang ; Guangshe Chen

This paper proposed a comprehensive color feature vector for tile online color consistency inspection. Non-uniform color quantitative method that was based on main color and human vision was put forward and the result accord with the human vision and the speed meet the requirement of tile online inspection. In order to synchronously meet the demand of tile global and local color difference inspection, especially to the tile with texture, global and composite color center of main color were introduced to describe tile color spatial distribution information. A comprehensive color feature vector including tile color global statistical information and spatial distribution information was designed and solved the difficult problem of tile color difference inspection and classification. The results show that this method was suitable for not only monochrome tile but also the tile with complex texture.

Published in:

Information Science and Engineering, 2008. ISISE '08. International Symposium on  (Volume:2 )

Date of Conference:

20-22 Dec. 2008