Close category search window
 

An Investigation of Non-Uniform Error Cost Function Design in Automatic Speech Recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Qiang Fu ; Office of the CTO, Broadcom Corp., Irvine, CA ; Biing-Hwang Juang

The classical Bayes decision theory [3] is the foundation of statistical pattern recognition. In [4], we have addressed the issue of non-uniform error criteria in statistical pattern recognition, and generalized the Bayes decision theory for pattern recognition tasks where errors over different classes have varying degrees of significance. We further introduced the weighted minimum classification error (MCE) method for a practical design of a statistical pattern recognition system to achieve empirical optimality when non-uniform error criteria are prescribed. However, one key issue in the weighted MCE method, the methodology of building a suitable non-uniform error cost function given the userpsilas requirements, has not been addressed yet. In this paper, we propose some viable techniques for the design of the non-uniform error cost function in the context of automatic speech recognition (ASR) according to different training scenarios. The experimental results on the TIDIGITS database [8] are presented to demonstrate the effectiveness of our methodologies.

Published in:
Machine Learning and Applications, 2008. ICMLA '08. Seventh International Conference on

Date of Conference: 11-13 Dec. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.