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On the Probabilistic Characterization of Nano-Based Circuits

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3 Author(s)
Xiaojun Lu ; Sch. of Comput., Univ. of Electron. Sci. & Technol. of China, Chengdu ; Jianping Li ; Wenyin Zhang

The paper presents a novel probabilistic logical model to describe the nanodevice states. It describes the probability distribution of outputs. The model is based on observations on statistical physics and Markov random field. Different from previous model [Bahar (2004), Nano, Quantum and Molecular Computing: Implications to High Level Design and Validation, S. Shukla and R. I. Bahar, Eds. Norwell, MA: Kluwer], it uses probability density function to describe the probability behavior of the nanoscale circuits, which is more reasonable and flexible.

Published in:

IEEE Transactions on Nanotechnology  (Volume:8 ,  Issue: 2 )