By Topic

Fault Diagnosis Technology for NAMP Based on BP Neural Network

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

In allusion to the insufficiency of the Built-in-test-equipment (BITE) of NAMP and the ground fault diagnosis equipment, the fault diagnosis theory and methods for a certain type NAMP based on BP neural network are investigated, and the fault diagnosis example is provided with the typical test item. The technology simplifies the structure of the fault diagnosis system, and has a farther effective distinguish from the source of fault diagnosed by BITE, and isolates the fault from the LRU level to the SRU level.

Published in:

Intelligent Networks and Intelligent Systems, 2008. ICINIS '08. First International Conference on

Date of Conference:

1-3 Nov. 2008