IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Direct and Inverse Problems o ... Help

Analysis of antenna characteristics in a Fresnel zone

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Levin, B.M. ; Lod, Israel

The method of calculating measurement error of directivity characteristics for antenna placed in a Fresnel zone is presented. The method of account is based on substitution of a plane area field with rays converging to an observation point by a no plane area field with parallel rays.

Published in:
Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory, 2008. DIPED 2008. 13th International Seminar/Workshop on

Date of Conference: 22-25 Sept. 2008

Page(s):
65 - 68
Print ISBN:
978-966-02-4649-2
INSPEC Accession Number:
10388980
Conference Location :
Tbilisi
Digital Object Identifier :
10.1109/DIPED.2008.4671805
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.