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Evaluation of short pulse thermal transient measurements

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1 Author(s)
Szekely, V. ; Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest

Thermal transient recording and the time constant spectrum analysis are widely used methods in the testing and qualification of IC packages. A limitation of these methods is that recording of the complete transient response requires long time. The paper offers algorithms to evaluate short pulse and short time measurements. These methods are suitable if only the extraction of the short time constants are needed. This is the case if the transient method is used for die attach quality checking.

Published in:

Thermal Inveatigation of ICs and Systems, 2008. THERMINIC 2008. 14th International Workshop on

Date of Conference:

24-26 Sept. 2008