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Automatic transistor lead inspection

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5 Author(s)
Hobson, C.A. ; Liverpool John Moores Univ., UK ; Wong, K.L. ; Hamzah, S. ; Arshad, N.M.
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This paper has described the development of a system for real-time inspection of transistor leads in a production environment. The system has been introduced into a factory in prototype form. This uses a transputer-based image processing system housed in an industrial PC and has given five months operational experience. Cost and other considerations require the production of an embedded system which will form part of the taping machine instrumentation and control system

Published in:

Image Processing and its Applications, 1995., Fifth International Conference on

Date of Conference:

4-6 Jul 1995