By Topic

Measurement of dielectric loss in thin parallel-sided samples using an untuned cavity

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Backhouse, P. ; Royal Signals and Radar Establishment, Malvern, UK ; Apsley, N. ; Smart, A.

The untuned cavity is used to measure dielectric loss in small samples of arbitrary shape. As long as certain constraints on loss and sample size are met, then results do not depend on reflections and interference effects, making the measurement quick and easy to interpret. The authors consider one situation in which more complicated analysis is required¿¿that of thin discs of high refractive index, where internal reflections and interference effects make the measured loss a function of sample thickness. We present an elementary analysis of this case, showing that by an extended set of measurements (over a range of thickness or frequency) both the real part of the dielectric constant ¿¿ and the true dielectric loss ¿¿ can be found. The theoretical predictions in the paper are supported by a series of measurements with thin ceramic discs.

Published in:

Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A  (Volume:132 ,  Issue: 5 )