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Xilinx Virtex V Field Programmable Gate Array Dose Rate Upset Investigations

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7 Author(s)
Vera, A. ; Dept. Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM ; Llamocca, D. ; Fabula, J. ; Kemp, W.
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The results of ionizing dose rate experiments on XC5VLX50T FPGAs demonstrate the most susceptible upset mechanism of commercial devices and provide insight into the effectiveness of dose rate hardening of nano-scale technology by using epi substrates.

Published in:

Radiation Effects Data Workshop, 2008 IEEE

Date of Conference:

14-18 July 2008