Referenced Items are not available for this document.
Radiation and SEE susceptibility of ECL devices manufactured by ON-semiconductor was studied. Test data shows that these devices are highly susceptible to single event transients and upsets when bombarded with heavy ions.
Published in:
Radiation Effects Data Workshop, 2008 IEEE
Date of Conference: 14-18 July 2008
- Page(s):
- 64 - 68
- Print ISBN:
- 978-1-4244-2545-7
- INSPEC Accession Number:
- 10264614
- Conference Location :
- Tucson, AZ
- Digital Object Identifier :
- 10.1109/REDW.2008.18
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