Referenced Items are not available for this document.
This paper reports heavy ion and proton induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers a sampling of devices tested over the past eight years.
Published in:
Radiation Effects Data Workshop, 2008 IEEE
Date of Conference: 14-18 July 2008
- Page(s):
- 21 - 30
- Print ISBN:
- 978-1-4244-2545-7
- INSPEC Accession Number:
- 10282168
- Conference Location :
- Tucson, AZ
- Digital Object Identifier :
- 10.1109/REDW.2008.11
- Product Type:
- Conference Publications
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